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[International Journals] June-Seok Lee and Kyo-Beum Lee, “Tolerance Control for the Inner Open-Switch Faults of a T-Type Three-Level Rectifier,” Journal of Power Electronics, vol. 14, no. 6, pp. 1157–1165, Nov. 2014. -SCIE

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  • 날짜 2019-06-30 15:15
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The T-type topology is a three-level topology that has an advantage in terms of its number of switching device and its efficiency

when compared to the neutral-point clamped (NPC)-type topology. With the recent increase in the usage of the T-type topology,

the interest in its reliability has also increased. Therefore, a tolerance control for a T-type rectifier is necessary to improve the

reliability of applications when an open-switch fault occurs. NPC-type rectifiers cannot eliminate input current distortion completely.

However, the T-type rectifier is able to restore distorted current. In this paper, a tolerance control for the Sx2 and Sx3 open-switch

faults of a T-type rectifier is proposed where it is advantageous in terms of efficiency when compared with other tolerance controls.

The performance of the proposed tolerance control is verified through simulation and experimental results. 

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