IGBT Fault Detection Experiment
  Fault detection experiment is able to protect the switches like IGBT against the overcurrent. If the overcurrent flows through the switches then the switches will be destroyed. So the gate-driver generates the fault signal after cutting off the PWM output signal for switch although the PWM input signal is still coming into the gate-driver. The parameter Rf, Cf, Rg is very important to adjust offset of Vdesat, time constant of Vdesat, blanking time.


Block diagram for IGBT protection circuit



Gate driver parameter for fault detection circuit


Experimental wave form


Experimental set