Seong-Yun Kim, Ha-Rang Jo, Sungjoon Cho, and Kyo-Beum Lee, "Estimation of Junction Temperature in a Two-Level Insulated-Gate Bipolar Transistor Inverter for Motor Drives," Journal of Electrical Engineering & Technology, vol. 17, pp. 1111-1119, Mar. 2022. > Paper

This paper presents a method for junction temperature estimation using the mathematical thermal model in a two-level insulated-gate bipolar

transistor (IGBT) inverter for motor drives. A power conversion system (PCS) comprises various components, and IGBT switches are the key components determining the reliability of the PCS. One of the challenges with regard to a PCS is improving its reliability. The failure of IGBTs is mainly due to

variations in the junction temperature. To predict the lifetime of the PCS, the thermal behavior of the IGBT must be defined. The thermal behavior is

dependent on the current that flows to the IGBT, and the load current profile is specific to the application. Generally, the switch module is

encapsulated; therefore, an additional manufacturing process is necessary for measuring the junction temperature. The presented temperature

estimation method using a mathematical model does not require an additional process for temperature measurement. An experiment is conducted

using a custom module to determine the thermal profile of the IGBT for 11-kW interior permanent magnet synchronous motor drives. The

effectiveness of the presented estimation method is verified by the simulation and experimental results.