Ha-Rang Jo, Youngjong Ko, and Kyo-Beum Lee, "Influence of Open Switch Failure on Normal Devices in HANPC Inverters," in Proc. ICEMS., Nov. 2021. > Paper

본문 바로가기

Paper

International Conference Ha-Rang Jo, Youngjong Ko, and Kyo-Beum Lee, "Influence of Open Switch Failure on Normal Devices in HANPC Inverters," in Proc. ICEMS., Nov. 2021.

2021

본문

This paper analyzes the normal switches losses when open switch failures in three-level hybrid active neutral point clamped (HANPC)

inverters. Three-level HANPC inverter has numerous Si-IGBTs and SiC-MOSFETs to improve the output quality. However, the three-

level HANPC inverter has high percent of switch failures due to using many switches. When the switch is a short fault, the inverter

system shut down thought overcurrent detection. The open switch failure is difficult to detect depending on fault-switch location. In

addition, the output quality is worsened and other devices get damages. The switch losses after switch failure are analyzed to prevent

the secondary switch failure in the future. The simulation results demonstrate the influence of switch devices considering the various

   open switch failure scenarios 

첨부파일

  • 178.pdf (775.1K) 42회 다운로드 | DATE : 2021-11-18 17:27:37
Total 212건 3 페이지
Paper 목록
번호 년도 논문명
182 2022 International Conference
181 2022 International Conference
180 2022 International Conference
179 2022 International Conference
열람중 2021 International Conference
177 2021 International Conference
176 2021 International Conference
175 2021 International Conference
174 2021 International Conference
173 2021 International Conference
172 2021 International Conference
171 2021 International Conference
170 2021 International Conference
169 2021 International Conference
168 2020 International Conference
게시물 검색

회원로그인

접속자집계

오늘
660
어제
1,387
최대
3,510
전체
840,808

그누보드5