Ha-Rang Jo, Youngjong Ko, and Kyo-Beum Lee, "Influence of Open Switch Failure on Normal Devices in HANPC Inverters," in Proc. ICEMS., Nov. 2021. > Paper

This paper analyzes the normal switches losses when open switch failures in three-level hybrid active neutral point clamped (HANPC)

inverters. Three-level HANPC inverter has numerous Si-IGBTs and SiC-MOSFETs to improve the output quality. However, the three-

level HANPC inverter has high percent of switch failures due to using many switches. When the switch is a short fault, the inverter

system shut down thought overcurrent detection. The open switch failure is difficult to detect depending on fault-switch location. In

addition, the output quality is worsened and other devices get damages. The switch losses after switch failure are analyzed to prevent

the secondary switch failure in the future. The simulation results demonstrate the influence of switch devices considering the various

   open switch failure scenarios