Hye-Ung Shin and Kyo-Beum Lee, "Fault Diagnosis Method for Power Transistors in Switched Reluctance Machine Drive System," in Proc. IPEMC (ECCE-Asia) Conf., May 2016, pp. 2481–2486. > Paper

본문 바로가기

Paper

International Conference Hye-Ung Shin and Kyo-Beum Lee, "Fault Diagnosis Method for Power Transistors in Switched Reluctance Machine Drive System," in Proc. IPEMC (ECCE-Asia) Conf., May 2016, pp. 2481–2486.

2016

본문

This paper proposes a new fault diagnosis method for a switched reluctance machine (SRM) drive system. The proposed fault

diagnosis method is capable of detecting both open circuit and short circuit faults in the power converter switches. In addition, the

position of a short fault in the asymmetric bridge converter can be detected using another proposed method. This fault occurrence

can be identified in the affected motor phase. A simulation is performed with a SRM drive system, and the results are presented to

verify the validity of the proposed method.

첨부파일

  • 100.pdf (1.9M) 2회 다운로드 | DATE : 2019-06-28 20:04:32
Total 975건 46 페이지
Paper 목록
번호 년도 논문명
열람중 2016 International Conference
299 2016 International Conference
298 2016 International Conference
297 2016 International Conference
296 2016 International Conference
295 2016 International Conference
294 2016 International Conference
293 2015 International Conference
292 2015 International Conference
291 2015 International Conference
290 2015 International Conference
289 2015 International Conference
288 2015 International Conference
287 2015 International Conference
286 2015 International Conference
게시물 검색

회원로그인

접속자집계

오늘
960
어제
1,222
최대
3,510
전체
972,531

그누보드5