Hak-Seung Ro, Dong-Hee Kim, Hae-Gwang Jeong, and Kyo-Beum Lee, "Tolerant Control for Power Transistor Faults in Switched Reluctance Motor Drives," IEEE Transactions on Industry Applications, vol. 51, no. 4, pp. 3187–3197, Jul./Aug. 2015. -SCI > Paper

This paper presents a fault identification and tolerant method for switched reluctance motor (SRM) drives. The reliability of a power

transistor in a power converter is the source of most problems in several industrial applications. It is critical to correctly diagnosis

the faults occurring in a drive system to avoid harmful accidents and to ensure continuity of operation. In this paper, two types of

faults, namely, short- and open-circuit faults, are analyzed on the basis of the current patterns of the power transistors of SRM drives.

A fault is detected when the measured amplitude of the current differs from that of the normal-state current. A fault-tolerant scheme

is applied according to the type of fault. Simulations and experiments are performed on a 1.0-kW SRM drive. The results are 

presented to verify the validity of the proposed method.