YoungJong Ko, Ju-Yeon Baek, Eun-Kyeol Shin, and Kyo-Beum Lee, "DC-Link Capacitor RMS Current of CHB Inverter under Open-Switch Failures," Journal of Electrical Engineering & Technology, in press. -SCIE > Paper

본문 바로가기

Paper

International Journals YoungJong Ko, Ju-Yeon Baek, Eun-Kyeol Shin, and Kyo-Beum Lee, "DC-Link Capacitor RMS Current of CHB Inverter under Open-Switch Failures," Journal of Electrical Engineering & Technology, in press. -SCIE

2024

본문

Cascaded H-Bridge (CHB) inverters have been attracted in high power application fields due to flexible power scalability with low voltage rating power semiconductor devices, whereas the increased number of the power semiconductor devices which are prone to failure has incurred the reliability issue. The present studies to improve the reliability have been focusing on fault detection, localization, and tolerant method of the switching device failure. 

Namely, it is missing to consider influence of the failure on DC-link capacitors, even though the capacitors are another major failure causes. In this

work, the influence of the open-switch failure on the DC-link capacitor current is analyzed, considering a 7-level CHB inverter modulated by either the phase-shifted carriers or the level-shifted carriers. The capacitor current in rms is mathematically derived when the CHB inverter is under the open

-switch failure and finally, the theoretical outcome is experimentally confirmed.

Total 286건 1 페이지
Paper 목록
번호 년도 논문명
286 2024 International Journals
285 2024 International Journals
284 2024 International Journals
283 2024 International Journals
282 2024 International Journals
281 2024 International Journals
280 2024 International Journals
279 2024 International Journals
278 2024 International Journals
277 2024 International Journals
열람중 2024 International Journals
275 2024 International Journals
274 2024 International Journals
273 2024 International Journals
272 2024 International Journals
게시물 검색

회원로그인

접속자집계

오늘
288
어제
563
최대
3,510
전체
870,079

그누보드5